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The objective
eye for
orange peel

wave-scan plus

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Measurement of surface structure
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The objective eye for orange peel
wave-scan plus

 

We see orange peel as a wavy pattern of light and dark areas on a glossy surface.

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Longterm waviness (orange peel) can be seen at distances of up to approx. 3 m.

Until now surfaces were visually assessed and described with terms such as peel or wet look.  Therefore the evaluation was very subjective.

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Shortterm waviness (micro waviness) is most obvious at close distances.

• Simulation of visual evaluation
The wave-scan plus simulates the visual evaluation.  Like our eyes, the wave-scan optically scan the wavy, light-dark pattern on the surface.  This produces objective measurement results with excellent visual correlation.

• Display of measurement results in selectable scales
Tension value
Rating value
Correlate with known industry visual test methods

Longterm waviness
Shortterm waviness
Additionally provide indirect information of influencing factors such as:
• substrate roughness
• flow/levelling properties of coatings
• process parameters - application method, curing condition
• baking position - horizontal vs. vertical

Fast and reliable on the line and in the lab
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• Truly portable, battery powered
You can measure the surface quality at any location without cables in your way.
 
pic07.gif (2855 bytes)• Easy to operate
User definable displays permit guided operation according to your measurement sequence and a clear sample identification.
 
• High reliability, self-calibrating
You receive reproducible results whether on test panels or curved surfaces, whether on solids or metallics.

 

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Measurement on coated plastic parts		 pic08.gif (8819 bytes)• Instrument memory, PC interface and software
This combination allows you to document the results and perform statistical and analytical evaluations.
 
pic09.gif (5981 bytes)• Trend analysis, Quality assurance
The program gardner-soft prepares the measurement results for universal processing with your own SPC to support efficient analysis of large quantities of production data.

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