1. New product 2. Semiconductor Fabrication-related Equipment 3. Large Plate-objection Inspection Equipment 4. Measuring Microscope
5. Industrial Microscope 6. High Magnification Zoom Microscope 7. Group of High-Quality Objective Lenses 8. The place of the inquiry
spa-500 sma600 sws-100
SPA-500/750
Projection Aligners for 1:2(reduction) and 1:1 projection exposures		 SMA-600FA
Fully Automation Non-conduct Double view mask aligner		 DZ2N
Zoom microscope		 SWS-100 IRV/IRT
Temporary fixing system for anodic bonding
1. New Product
  1. SPA-500/750
    Projection Aligners for 1:2(reduction) and 1:1 projection exposures
  2. SMA-600FA
    Fully Automation Non-conduct Double view mask aligner
  3. SWS-100 IRV/IRT
    Temporary fixing system for anodic bonding
  4. DZ2-IRV/IRT
    Reflection/permeation type Infrared rays zoom microscope
  5. DZ2N
    Zoom microscope
  6. HISOMET−２N（DH2N）
    Non-contact depth measuring with differential interferencemicroscope system
  7. PEM-6M
    Double-view mask aligner exposure system
2. Semiconductor Fabrication-related Equipment















BACK
  1. SPA-500/750
    Projection Aligners for 1:2(reduction) and 1:1 projection exposures
  2. SMA-600FA
    Fully Automation Non-conduct Double view mask aligner
  3. PEM-6M
    Double-view mask aligner exposure system
  4. PEM800(Compact & Economy type for Research & Development）、PEM-1000/2000（Applocable to wafers up to 4&6inches in diameter）PEM-4FA/6FA（Fully Automated Type）
    Double-view Mask Aligner
  5. SWS-100 IRV/IRT
    Temporary fixing system for anodic bonding
  6. SIG-2
    Anodic Bonder
  7. SHI-100
    Image Measuring System
  8. DCM-60
    Double view microscope(applicable to wafers up to 6innches in diameter)
  9. THS-10（Manual Type）/20（Automatic Type）
    Non-contact depth measuring microscope system)
3.  Large Plate-objection Inspection Equipment


BACK
  1. DH-150
    Large non-contact depth measuring instrument
  2. LFM-2500
    Automatic lead frame step measuring system
4. Measuring Microscope






BACK
  1. HISOMET−２（DH2）
    Non-contact depth measuring microscope system
    HISOMET−２N（DH2N）
    Non-contact depth measuring with differential interferencemicroscope system
  2. SG-V
    Precision measuring microscope
  3. NSM
    Measuring microscope
5. Industrial
Microscope






BACK
  1. NMR
    Universal metallograph
  2. MCB-1
    Inverted type metallurgical microscope
  3. RMM
    Portable microscope
6. High Magnification Zoom Microscope





BACK
  1. DZ2-IRV/IRT
    Reflection/permeation type Infrared rays zoom microscope
  2. DZ2
    High magnification zoom microscope
  3. DZ2N
    Zoom microscope
  4. DZ101
    Wide-field zoom microscope
7. Group of High-Quality Objective Lenses
8. The place of the inquiry

BACK
  • Domestic Sales Part  TEL 03-3966-2204 FAX 03-3966-2230
  • Oversea  Sales Part TEL 03-3966-2206 FAX 03-3966-2230
  • Sales Manegement  TEL 03-3966-2203 FAX 03-3966-2230